Speckle Noise Removal in Image-Based Detection of Refractive Index Changes in Porous Silicon Microarrays

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aut.relation.articlenumber15001en_NZ
aut.relation.journalScientific Reportsen_NZ
aut.relation.volume9en_NZ
aut.researcherKassabov, Nikola
dc.contributor.authorRen, Ren_NZ
dc.contributor.authorGuo, Zen_NZ
dc.contributor.authorJia, Zen_NZ
dc.contributor.authorYang, Jen_NZ
dc.contributor.authorKasabov, NKen_NZ
dc.contributor.authorLi, Cen_NZ
dc.date.accessioned2022-02-04T03:06:02Z
dc.date.available2022-02-04T03:06:02Z
dc.date.copyright2019en_NZ
dc.date.issued2019en_NZ
dc.description.abstractBased on porous silicon (PSi) microarray images, we propose a new method called the phagocytosis algorithm (PGY) for removing the influence of speckle noise on image gray values. In a theoretical analysis, speckle noise of different intensities is added to images, and a suitable denoising method is developed to restore the image gray level. This method can be used to reduce the influence of speckle noise on the gray values of PSi microarray images to improve the accuracy of detection and increase detection sensitivity. In experiments, the method is applied to detect refractive index changes in PSi microcavity images, and a good linear relationship between the gray level change and the refractive index change is obtained. In addition, the algorithm is applied to a PSi microarray image, and good results are obtained.en_NZ
dc.identifier.citationScientific Reports 9, 15001 (2019). https://doi.org/10.1038/s41598-019-51435-y
dc.identifier.doi10.1038/s41598-019-51435-yen_NZ
dc.identifier.issn2045-2322en_NZ
dc.identifier.issn2045-2322en_NZ
dc.identifier.urihttps://hdl.handle.net/10292/14880
dc.publisherSpringer Nature
dc.relation.urihttps://www.nature.com/articles/s41598-019-51435-y
dc.rights© The Author(s) 2019. This article is licensed under a Creative Commons Attribution 4.0 International License, which permits use, sharing, adaptation, distribution and reproduction in any medium or format, as long as you give appropriate credit to the original author(s) and the source, provide a link to the Creative Commons license, and indicate if changes were made. Te images or other third party material in this article are included in the article’s Creative Commons license, unless indicated otherwise in a credit line to the material. If material is not included in the article’s Creative Commons license and your intended use is not permitted by statutory regulation or exceeds the permitted use, you will need to obtain permission directly from the copyright holder. To view a copy of this license, visit http://creativecommons.org/licenses/by/4.0/.
dc.rights.accessrightsOpenAccessen_NZ
dc.titleSpeckle Noise Removal in Image-Based Detection of Refractive Index Changes in Porous Silicon Microarraysen_NZ
dc.typeJournal Article
pubs.elements-id365196
pubs.organisational-data/AUT
pubs.organisational-data/AUT/Faculty of Design & Creative Technologies
pubs.organisational-data/AUT/PBRF
pubs.organisational-data/AUT/PBRF/PBRF Design and Creative Technologies
pubs.organisational-data/AUT/PBRF/PBRF Design and Creative Technologies/PBRF ECMS
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