Constructing New Backbone Networks via Space-Frequency Interactive Convolution for Deepfake Detection

Date
2023-10-16
Authors
Guo, Zhiqing
Jia, Zhenhong
Wang, Liejun
Wang, Dewang
Yang, Gaobo
Kasabov, Nikola
Supervisor
Item type
Journal Article
Degree name
Journal Title
Journal ISSN
Volume Title
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Abstract

The serious concerns over the negative impacts of Deepfakes have attracted wide attentions in the community of multimedia forensics. The existing detection works achieve deepfake detection by improving the traditional backbone networks to capture subtle manipulation traces. However, there is no attempt to construct new backbone networks with different structures for Deepfake detection by improving the internal feature representation of convolution. In this work, we propose a novel Space-Frequency Interactive Convolution (SFIConv) to efficiently model the manipulation clues left by Deepfake. To obtain high-frequency features from tampering traces, a Multichannel Constrained Separable Convolution (MCSConv) is designed as the component of the proposed SFIConv, which learns space-frequency features via three stages, namely generation, interaction and fusion. In addition, SFIConv can replace the vanilla convolution in any backbone networks without changing the network structure. Extensive experimental results show that seamlessly equipping SFIConv into the backbone network greatly improves the accuracy for Deepfake detection. In addition, the space-frequency interaction mechanism does benefit to capturing common artifact features, thus achieving better results in cross-dataset evaluation. Our code will be available at https://github.com/EricGzq/SFIConv.

Description
Keywords
46 Information and Computing Sciences , 4611 Machine Learning , 08 Information and Computing Sciences , 09 Engineering , Strategic, Defence & Security Studies , 40 Engineering , 46 Information and computing sciences
Source
IEEE Transactions on Information Forensics and Security, ISSN: 1556-6013 (Print); 1556-6021 (Online), Institute of Electrical and Electronics Engineers (IEEE), PP(99), 1-1. doi: 10.1109/tifs.2023.3324739
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