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  •   Open Research
  • AUT Faculties
  • Faculty of Design and Creative Technologies (Te Ara Auaha)
  • School of Engineering, Computer and Mathematical Sciences - Te Kura Mātai Pūhanga, Rorohiko, Pāngarau
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Cascade effects of load shedding in coupled networks

Tauch, S; Liu, W; Pears, R
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Cascade effects of load shedding in coupled networks_v3.pdf (663.6Kb)
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http://hdl.handle.net/10292/6141
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Abstract
Intricate webs of interlinked critical infrastructures such as electrical grid, telecommunication, and transportation are essential for the minimal functioning of contemporary societies and economies. Advances in Information and Communication Technology (ICT) underpin the increasing interconnectivity of these systems which created new vulnerabilities that can be seriously affected by hardware failure, link cut, human error, natural disaster, physical-attacks and cyber-attacks. Failure of a fraction on nodes may lead to failure of dependent nodes in the other networks. Therefore, the main objective of this paper is to investigate the cascades phenomena caused by load shedding between two interconnected networks using Bak-Tang-Wiesenfeld sandpile modeling. We have found that, large avalanche occurred when node degree and/interconnectivity link become dense. In addition, the coupled random-regular networks have been found to be more robust than the coupled Erdos-Renyi networks. However, coupled random-regular networks are vulnerable to random attack and coupled Erdos-Renyi networks are vulnerable to target attack due to the degree distribution.
Keywords
Cascading effects; Interdependence; Coupled networks; Network robustness; Complex networks; Sandpile modelling
Date
December 31, 2013
Source
19th IEEE International Conference on Networks (ICON2013) held at Orchard Hotel, Singapore, 2013-12-11 to 2013-10-13, published in: Proceedings of the 19th IEEE International Conference on Networks (ICON 2013).
Item Type
Conference Contribution
Publisher
IEEE
Publisher's Version
http://www.ieee-icon.org/2013/
Rights Statement
Copyright © 2013 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works.

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