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dc.identifier.citationFoods, 7(10), 169. doi:10.3390/foods7100169
dc.description.abstractHigh-Pressure Processing (HPP) and Pulsed Electric Fields (PEF) processing technologies are being used increasingly on a commercial basis, with high-quality labelled fruit juices being one of the most important promotion strategies. Quality-related enzymes, which might still be active after HPP and PEF pasteurization, can cause undesirable aroma changes during storage. This study investigated volatile changes during the shelf life of PEF (15.5 kV/cm and specific energy of 158 kJ/L), HPP (600 MPa for 3 min), and thermally (72 °C for 15 s) pasteurized Jazz apple juices-up to five weeks. To have an increased insight into the volatile changes, an integrated instrumental (GC-MS) and data analysis (chemometrics) approach was implemented. Immediately after pasteurization, PEF processing resulted a better retention of odor-active volatiles, such as (E)-2-hexenal and hexyl acetate, whereas thermal processing lowered their amount. During refrigerated storage, these volatiles have gradually decreased in all processed juices. By the end of storage, the amount of these aroma relevant volatiles appears to still be higher in PEF and HPP pasteurized juices compared to their conventional counterparts. This study demonstrated the potential of advanced chemometric approaches to obtain increased insight into complex shelf life changes.en_NZ
dc.rights© 2018 by the authors. Licensee MDPI, Basel, Switzerland. This article is an open access article distributed under the terms and conditions of the Creative Commons Attribution (CC BY) license (
dc.subjectApple juiceen_NZ
dc.subjectHigh-pressure processingen_NZ
dc.subjectPulsed electric fieldsen_NZ
dc.subjectShelf lifeen_NZ
dc.titleA Chemometrics Approach Comparing Volatile Changes During the Shelf Life of Apple Juice Processed by Pulsed Electric Fields, High Pressure and Thermal Pasteurizationen_NZ
dc.typeJournal Article
dark.contributor.authorKebede, Ben_NZ
dark.contributor.authorLee, PYen_NZ
dark.contributor.authorLeong, SYen_NZ
dark.contributor.authorKethireddy, Ven_NZ
dark.contributor.authorMa, Qen_NZ
dark.contributor.authorAganovic, Ken_NZ
dark.contributor.authorEyres, GTen_NZ
dark.contributor.authorHamid, Nen_NZ
dark.contributor.authorOey, Ien_NZ

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